Demonstration title

TAST - Toolkit for Aspect-oriented Tracing

Organizers

Sabine Canditt (Siemens AG, Munich, Germany) Tina Low (Siemens AG, Munich, Germany)

Day

Thursday April 25, 2:00-2:45
Friday April 26, 11:45-12:30

Monitoring and diagnostic tools are essential for successful development and operation of complex software systems. The Monitoring and Performance Engineering team at the Siemens Corporate Technology department CT SE 1 developed a tool called TMT (Test and Monitoring Tool) that visualizes so-called traces, a sequence of designated application events. In order to generate trace information, probes that intercept and log application events have to be introduced in the System Under Test. This instrumentation can be done manually, but this "cut and paste" approach is work intensive and error prone. As tracing is a typical "crosscutting concern", we used AspectJ to develop the instrumentation aid TAST for Java applications.

TAST encapsulates all tracing-related issues (incl. the generation and transmission of unique identifiers that are necessary to correlate corresponding trace events). It offers many advantages over manual instrumentation with respect to maintainance, documentation, consistency, completeness and reusability.

In our demonstration we show how an application is instrumented with AspectJ. The audience will be able to watch the running application producing traces that are visualized by TMT and get an insight in the visualization and analysis functionality of TMT.

URL:http://java.sun.com/products/jfc/tsc/sightings/S04.html